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我們的開放軟體附有2個等級的簡單編程,可讓操作員和工程師輕鬆掌握。
使用即時相機可輕鬆編輯測試程序,該即時相機可直接觀看演練順序,以教導自動化過程步驟,位置和命令,以實現完美的對位和準確的測試。
節省時間並從簡易模式開始編輯程式。 可選擇切換到專業模式,並添加更複雜的功能以實現最佳定制化。
輕鬆輸入或輸出不同wafer map檔案格式,例如: KLARF, (S)INF, G85,或是其他格式讓你可以完整地追溯. 缺陷或測試位置顯示在wafer map中,直接點取畫面可自動移動至點選位置來進行測試或分析。
使用2D條碼讀取器來快速啟動測試程式。 掃描QR碼或條碼後,將自動開啟自動化,測試方法或表單。
為了獲得更好的可追溯性,您可以使用自定義表格來存儲其他數據以及測量結果。
J.F. Kennedylaan 14b
5981 XC
Panningen
The Netherlands
Am Haupttor / Bürocenter
06237
Leuna
Germany
27182 Burbank
Foothill Ranch
CA 92610
United States
72/7 M.12 Soi. Soonthornwipak
Bangpla, Bangphli,
10540 Samut Prakan
Thailand
No. 157, Zhongzheng
6th St., Hukou
Township, Hsinchu
County 303,
Taiwan (R.O.C.)
Room 2012
Haichuang Mansion,
No.288 Dengyun Road,
High-tech district, Kunshan,
Jiang Su, China
開發世界一流的結合力測試技術,並與全球合作夥伴一起在全世界提供當地服務支援。
J.F. Kennedylaan 14b
5981 XC
Panningen
The Netherlands