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轻松输入或输出不同wafer map文件格式,例如: KLARF, (S)INF, G85,或是其他格式让你可以完整地追溯. 缺陷或测试位置显示在wafer map中,直接点取画面可自动移动至点选位置来进行测试或分析。
使用2D条码读取器来快速启动测试程序。 扫描QR码或条码后,将自动开启自动化,测试方法或窗体。
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J.F. Kennedylaan 14b
5981 XC
Panningen
The Netherlands
Am Haupttor / Bürocenter
06237
Leuna
Germany
27182 Burbank
Foothill Ranch
CA 92610
United States
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Bangpla, Bangphli,
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Thailand
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County 303,
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Room 2012
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Jiang Su, China
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J.F. Kennedylaan 14b
5981 XC
Panningen
The Netherlands